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PBIT


Overview

Power-On Built-In Test Solution for ONYX

 The PBIT from Ecrin Systems has been designed for Power-Up test coverage and problem solving on ONYX SWaP-C rugged computers.

According to the results of the tests, the system can decide to cancel the normal operation and enter an alternate mode, or stop all activity and report a fault.

Specifications

PBIT is executed from a cold start. Performed at BIOS level, under UEFI environment, PBIT is OS independent, and allows intrusive test execution. PBIT can run automatically or in an interactive mode under UEFI thanks the Graphical User-friendly Interface (GUI).

PBIT supports 3 different execution modes to cope with your execution environment. Please refer to the datasheet for more information.

Fully customisable through the UEFI GUI, the three test profiles can be tuned by selecting the individual component to be tested. As a result, the boot time can be tailored to your needs by choosing a specific test sequence for your application.

PBIT Graphical User’s Interface allows you to determine which component is critical and should lead to a computer stop or warning message in case of failure.

PBIT is executed under UEFI environment, thus results are available at UEFI GUI and customer application levels.

The tests for behaviour and health status include: Packaging failure, solder cracking, corrosion, semi-conductor failure, capacitor leakage and PCB electrical leak detection.

Technical documents

Ordering information

Please contact Sarsen Technology to discuss your application.

Associated products